nanome|x

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nanome|x

The nanome|x is an ultra high-resolution nanofocus^® X-ray system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. This system is upgradable to a nanoCT^®.

Possible applications include:

• Mounted printed circuit boards
  
• Semiconductors and other electronic components
  

Special features:

• Max. inspection area 24“ x 22“
• Real-time detector resolution of 2 or 4 megapixel
• 24" TFT display with 2 megapixel detector resolution
• 30" TFT display with 4 megapixel detector resolution
  
• Detail detectability of <0,3µ (300nm)
• Max. magnification up to 25.000x
• Max. tube voltage of 180kV / 15W
  
• Automated X-ray inspections of  BGAs, CSPs, QFPs, QFNs, PTHs, Voiding Calculation, Wire Sweep
• optional 3D computed tomography
• Low-maintenance, long-life (open) nanofocus^® tube
• High-power nanofocus^® tube
• Steplessly adjustable up to 70°, rotation 0°-360°
• Integrated noise suppression system
• Ergonomically designed control panel
• Easy-view-configuration: the X-ray image shows the object exactly as the operator sees it through the radiation protection window.

For more information on this particular X-ray inspection system, please contact us, we will be more than glad to answer your question! 

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