Today phoenix|x-ray launched their new dual-ovhm|module with both a conventional image intensifier and the contrast sensitive image detector, high-contrast|set.
The oblique view at highest magnification (ovhm) technology that had been invented by the global manufacturer of microfocus and nanofocus X-ray inspection systems, phoenix|x-ray, offered image generation with either an analogue image intensifier or with a digital 16-bit image detector. The systems were optimised for the visualisation of weakly absorbing and contrasting materials like rubber and epoxies with one technique or of those that evolve a good contrast like lead and iron with the other one.
The special advantage of the new dual-ovhm|module is the capability to generate realtime X-ray images of the same sample with both detectors at an infinitely adjustable penetration angle in order to compare them and save them for processing with the dedicated X-ray imaging software. Thus the operator can, with the same field of view, quickly detect failures in the bonding of a bond-wire and inspect the number and size of voids in non-conductive die-attach of an IC all with one system. Some inspection tasks, e.g. the evaluation of the pad-wetting quality of BGA solder joints require an inspection under different rotation-angles. The CNC-driven manipulation unit from phoenix|x-ray in combination with the new dual-ovhm|module allows a 360° infinitely variable isocentric view of the sample without the need to manually adapt the field of view. The novel combination of X-ray image intensifier and digital detector with the well-known, application orientated imaging software from phoenix|x-ray, image|optimiser, is the perfect tool to gain maximum information from the X-ray inspection without having to change the system configuration nor needing to adapt to a new software interface.
The dual-ovhm|module is available for the pcba|analyser and the ml|analyser from phoenix|x-ray. Image caption: The pcba|analyser with dual-ovhm|module