Targeting to fulfil the specific needs of the semiconductor industries phoenix|x-ray, world-wide operating manufacturer of X-ray inspection systems, recently launched the new package|analyser nf with optional high-contrast|set providing an ultra-high resolution of down to as 500 nanometers (0.5 microns), a 3500-fold maximum total magnification and contrast difference detection of 0.5 %.
The 100 kV open nanofocus tube has been developed to resolve finest details in the X-ray image, e.g. cracks in bond wires that would not be detectable with a regular microfocus X-ray tube due to the lower image resolution. Thus the innovation of this tube is the extremely small focal spot of the X-ray beam on the target which is a first in the serial production of X-ray tubes.
The optional high-contrast|set with a 14-bit grey scale distinction in combination with the changeable 160 kV tube head makes it possible to visualise failures and voids in materials that have a poor X-ray absorption capability e.g. non-conductive die-attach or molding materials.
Standard equipment of all products of the phoenix|x-ray analyser|series are automatic system start up, automatic beam centring, automatic beam focussing and automatic target survey. The low-dose|module that saves the samples from overexposure to X-ray radiation is available upon request.