San Diego (January 23, 2002) – phoenix|x-ray Systems + Services Inc., innovator of the only commercially available nanofocus X–ray system and first fully automated failure analysis system, today announced it was recognized for excellence in customer service at this year’s APEX trade show in an award presented by Circuits Assembly Magazine and Technology Forecasters, Inc. This is the tenth year of the award series and is presented each year in recognition of superior service and is the only awards that honor customer service in the electronic assembly industry.
phoenix|x–ray, 2 years in the X–ray
inspection and failure analysis industry, received top honors for service in the
Test and Inspection category of Electronics Assembly Equipment Suppliers.
Evaluated by an independent third party forum, the company excelled in key
categories determining excellence in service from interviews with 15 customers
from each entrant. Customers rated the entrants on a scale of 1 to 5, 5 being
superior, in areas of dependability, ease of use, responsiveness, technology and
“value for the price” scoring high marks.
“It’s an incredible feeling to
be evaluated by your own customers,” said Jeff Mirliss, phoenix|x–ray’s customer
service manager, “and have no say or influence on what they have to say and then
come out on top. It’s a definite testament to what we set out to achieve just
over two years ago.
“Through our continued ‘can do’ customer relationship
and the introduction of such breakthrough technologies as our nanofocus x–ray
system, we will only get better.
Also a premiere for the company,
phoenix|x–ray introduced at the show their nanofocus X-ray tube capable of
obtaining images down to 0.5 micrometers (500 nanometers), small enough to
sharply and clearly image microvias. It is the first of its kind available
commercially to the market. Also introduced at the show is the company’s new
x-ray inspection system that fills the void between fast automated inline and
offline semi-automatic or manual failure analysis systems, the pcba|sentry. The
new system is a fully automated microfocus X-ray system for the inspection and
failure analysis of area array packages providing powerful BGA and µBGA image
analysis by repeatedly determining opens and wetting errors instantly at known
levels of confidence, making it the first system of its kind.