In a high-resolution X-ray system, the specimen to be inspected is placed between the source of radiation, the X-ray tube, and the detecting device. The specimen is located on a sample carrier and its position can be manipulated in direction of the x-, y-, z-axis. The z-axis describes the line between tube and detector. Hence, moving the sample in direction of the z-axis moves it either closer to or further away from the detector thus affecting geometric magnification. Moreover, it is possible to set-up highly precise automated inspection routines during which tube, manipulator and detector are controlled fully electronically.
Depending upon the inspection task at hand, the beam of radiation may propagate either vertically and horizontally. For inspecting circuit boards, we recommend the vertical beam, since this allows placing the circuit board in horizontal position on the sample carrier (see image). Large, heavy parts, such as castings, that need rotating and tilting for best results, are best inspected using a horizontal beam and the multiple-axes manipulator.